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Effects of optical back reflection on long wavelength VCSELs

M. Steib and Y. Vandyshev

Finisar Corp.

R. Johnson

Advanced Optical Components

G. Franz

Fachhochschule München (Germany)

Hongyu Deng

Finisar Corp.

(published online Feb. 10, 2006)

Understanding of the noise characteristics of a long wavelength (LW) vertical cavity surface-emitting laser (VCSEL) under optical back reflection is crucial for its applications in optical fiber data communication. VCSELs at near 1.31µm are tested and the relative intensity noise (RIN) is measured in the presence of different levels of optical reflection intensity. Innovative LW VCSEL packaging solutions are demonstrated to achieve robust low cost error-free datacommunication systems.

©2006 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

doi:10.1117/12.660841

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